17 results
Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 720-721
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- July 2011
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A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1462-1463
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- July 2011
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Analysis of Metal Nanoparticles in Biological Tissues Specimens Using Various Surface Analytical Techniques
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 434-435
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- July 2010
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FIB Clean Up of ToF-SIMS Craters for Microstructural Characterization
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 238-239
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- July 2010
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Fabrication and Characterization of Ultra-High Aspect Ratio Features in Gold Using the Helium Ion Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 198-199
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- July 2010
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Complete Analysis of Samples using Complementary Techniques
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 432-433
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- July 2010
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Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 270-271
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- July 2010
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Solving Characterization Challenges for CdTe-Based Thin Film Photovoltaics: Comparison of Analytical Techniques
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1386-1387
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- July 2009
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Improvements in Three-Dimensional Compositional Analysis of Complex Alloys
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 294-295
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- July 2009
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Comparison of Sample Preparation Methods for Analysis of Biological Samples by High Vacuum Techniques
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 28-29
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- August 2008
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Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 456-457
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- August 2008
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Surface Versus Bulk Defects on Devices using Complementary Techniques
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 478-479
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- August 2008
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Multivariate Statistical Analysis of Time of Flight Secondary Ion Mass Spectrometry Raw Data Files
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1356-1357
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- August 2007
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Exploration of a Butterfly Wing Using a Diverse Suite of Characterization Techniques
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1228-1229
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- August 2006
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Applications of ToF-SIMS in a Research and Development Laboratory
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1226-1227
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- August 2006
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Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectral Images - Unbiased Analysis of the Entire 3-Dimensional Data Cube
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 442-443
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- August 2005
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Fluoroalkyl Iodide Photodecomposition on Diamond (100) - an Efficient Route to The Fluorination of Diamond Surfaces
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- MRS Online Proceedings Library Archive / Volume 416 / 1995
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- 10 February 2011, 293
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- 1995
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